Show simple item record

dc.contributor.author{"last":"Lehmann","first":"Peter Prof. Dr.-Ing. habil.","affiliation":"Measurement Technology Group, Faculty of Electrical Engineering and Computer Science, University of Kassel","id":"orcid","id_value":"0000-0003-0051-5066"}
dc.contributor.author{"last":"Hagemeier","first":"Sebastian Dr.-Ing.","affiliation":"Measurement Technology Group, Faculty of Electrical Engineering and Computer Science, University of Kassel","id":"orcid","id_value":"0000-0002-3057-0034"}
dc.contributor.author{"last":"Pahl","first":"Tobias","affiliation":"Measurement Technology Group, Faculty of Electrical Engineering and Computer Science, University of Kassel","id":"orcid","id_value":"0000-0002-8610-8818"}
dc.date.accessioned2023-12-13T07:58:41Z
dc.date.available2023-12-13T07:58:41Z
dc.identifier.urihttps://daks.uni-kassel.de/handle/123456789/66
dc.identifier.urihttps://doi.org/10.48662/daks-33
dc.descriptionThis dataset contains raw data obtained by a Mirau coherence scanning interferometer (50x, NA = 0.55, red LED with a central wavelength of 630 nm) and resulting 3D surface topographies. The raw data includes the depth response signals obtained from a diamond milled aluminum mirror. These data are evaluated using envelope as well as phase signal processing algorithms (the so-called LT-algorithm) with an evaluation wavelength of 670 nm, leading to the results presented in Figure 15 of the corresponding article mentioned below. Both the raw data as well as the results are saved in an HDF5 file format and can be used as shown by example codes programmed using the software Python and MATLAB. </br> IMPORTANT: In case you use the data please cite our corresponding article mentioned below.de_DE
dc.descriptionThe 20IND07 TracOptic project has received funding from the EMPIR programme co-financed by the Participating States and from the European Union’s Horizon 2020 research and innovation programme.
dc.description.sponsorship{"funderName":"Horizon Europe","awardTitle":"EMPIR - European Metrology Programme for Innovation and Research","awardNumber":"201ND07"}en
dc.language.isoengde_DE
dc.relation{"relationType":"IsSupplementTo","relatedIdentifierType":"DOI","id_value":"https://doi.org/10.3390/metrology1020009"}
dc.rightsCreative Commons Attribution 4.0
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/
dc.subjectSurface measurementde_DE
dc.subject.classification308-01 Optik, Quantenoptik, Physik der Atome, Moleküle und Plasmende_DE
dc.subject.classification407-02 Messsystemede_DE
dc.subject.classification407-03 Mikrosystemede_DE
dc.subject.ddc530
dc.subject.ddc621.3
dc.titleThree-Dimensional Transfer Functions of Interference Microscopes [Dataset]de_DE
dc.typeDatasetde_DE
local.ka.facultyFB16:Elektrotechnik/Informatikde_DE
local.ka.departmentFachgebiet Messtechnikde_DE


Files in this item

Thumbnail
Thumbnail

This item appears in the following Collection(s)

Show simple item record

Creative Commons Attribution 4.0
Except where otherwise noted, this item's license is described as Creative Commons Attribution 4.0